Image: Micron 45 nm NOR Flash Data Retention
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Description: Data (stored as threshold voltage) is lost at an exponential rate, dependent on temperature.[1]
Title: Micron 45 nm NOR Flash Data Retention
Credit: Own work
Author: Naturalion
Usage Terms: Creative Commons Attribution-Share Alike 4.0
License: CC BY-SA 4.0
License Link: https://creativecommons.org/licenses/by-sa/4.0
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